- 2005 lsr3330/t doc. no : qw0905- rev. : date : 18 - oct a low current round type led lamps lsr3330/t data sheet ligitek electronics co.,ltd. property of ligitek only
directivity radiation 75% 50% 75% 100% 25% 0 50% 25% -30 x -60 x 0 x 30 x 100% 60 x 25.0min 1.5max note : 1.all dimension are in millimeter tolerance is ? 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. 2.54typ 1.0min ?? 0.5 typ 7.6 8.6 5.9 5.0 ligitek electronics co.,ltd. property of ligitek only package dimensions part no. lsr3330/t 1/4 page
red diffused lens typical electrical & optical characteristics (ta=25 j ) symbol tsol t opr tstg pd absolute maximum ratings at ta=25 j note : 1.the forward voltage data did not including ? 0.1v testing tolerance. 2. the luminous intensity data did not including ? 15% testing tolerance. gaalas material lsr3330/t part no emitted red color operating temperature soldering temperature storage temperature peak forward current duty 1/10@10khz reverse current @5v power dissipation ir i fp forward current parameter i f part no. lsr3330/t 16 luminous intensity @2ma(mcd) typ. spectral halfwidth ??f nm 660 20 peak wave length f pnm 2.0 max. 1.5 min. 9.0 min. forward voltage @ ma(v) 2 36 viewing angle 2 c 1/2 (deg) -40 ~ +85 max 260 j for 5 sec max (2mm from body) -40 ~ +100 j j 100 100 10 ratings sr 30 mw g a ma ma unit ligitek electronics co.,ltd. property of ligitek only 2/4 page
fig.3 forward voltage vs. temperature fig.5 relative intensity vs. wavelength ambient temperature( j ) relative intensity@20ma wavelength (nm) forward voltage@20ma normalize @25 j fig.4 relative intensity vs. temperature ambient temperature( j ) relative intensity@20ma normalize @25 j typical electro-optical characteristics curve forward voltage(v) fig.1 forward current vs. forward voltage forward current(ma) forward current(ma) fig.2 relative intensity vs. forward current relative intensity normalize @20ma ligitek electronics co.,ltd. property of ligitek only 1.0 0.1 1.0 10 100 1000 1.0 10 100 1000 0.0 0.5 1.0 1.5 2.0 2.5 3.0 -40 -20 0 20 40 60 1.0 1.1 1.2 600 650 700 750 0.0 0.5 1.0 2.0 3.0 4.0 5.0 80 100 0.8 0.9 -20 -40 40 20 080100 60 2.0 0.0 0.5 1.0 1.5 2.5 3.0 sr chip page 3/4 lsr3330/t part no.
mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 1.t.sol=230 j? 5 j 2.dwell time=5 ? 1sec solderability test this test intended to see soldering well performed or not. reliability test: mil-std-883:1008 jis c 7021: b-10 jis c 7021: b-12 mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 mil-std-202:103b jis c 7021: b-11 mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. 1.ta=-40 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) low temperature storage test 1.t.sol=260 j? 5 j 2.dwell time= 10 ? 1sec. 1.ta=105 j? 5 j &-40 j? 5 j (10min) (10min) 2.total 10 cycles thermal shock test solder resistance test high temperature high humidity test 1.ta=65 j? 5 j 2.rh=90 %~95% 3.t=240hrs ? 2hrs the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. the purpose of this test is the resistance of the device under tropical for hous. test condition 1.ta=105 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, + 72hrs) high temperature storage test test item operating life test the purpose of this is the resistance of the device which is laid under ondition of high temperature for hours. description this test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. reference standard ligitek electronics co.,ltd. property of ligitek only part no. lsr3330/t page 4/4
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