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 NIKO-SEM
N-Channel Logic Level Enhancement Mode Field Effect Transistor
P3057LD
TO-252 (DPAK)
D
PRODUCT SUMMARY V(BR)DSS 25 RDS(ON) 50m ID 12A 1. GATE 2. DRAIN 3. SOURCE
G S
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ABSOLUTE MAXIMUM RATINGS (TC = 25 C Unless Otherwise Noted) PARAMETERS/TEST CONDITIONS Gate-Source Voltage Continuous Drain Current Pulsed Drain Current Avalanche Energy Repetitive Avalanche Energy Power Dissipation
2 1
SYMBOL VGS
LIMITS 20 12 8 45 60 3 48 20 -55 to 150 275
UNITS V
TC = 25 C TC = 100 C L = 0.1mH L = 0.05mH TC = 25 C TC = 100 C
ID IDM EAS EAR PD Tj, Tstg TL
A
mJ
W
Operating Junction & Storage Temperature Range Lead Temperature ( /16" from case for 10 sec.) THERMAL RESISTANCE RATINGS THERMAL RESISTANCE Junction-to-Case Junction-to-Ambient Case-to-Heatsink
1 2 1
C
SYMBOL RJC RJA RCS
TYPICAL
MAXIMUM 3 75
UNITS
C / W
1
Pulse width limited by maximum junction temperature. Duty cycle 1%
ELECTRICAL CHARACTERISTICS (TC = 25 C, Unless Otherwise Noted) PARAMETER SYMBOL TEST CONDITIONS STATIC Drain-Source Breakdown Voltage Gate Threshold Voltage Gate-Body Leakage Zero Gate Voltage Drain Current On-State Drain Current1 V(BR)DSS VGS(th) IGSS IDSS ID(ON) VGS = 0V, ID = 250A VDS = VGS, ID = 250A VDS = 0V, VGS = 20V VDS = 20V, VGS = 0V VDS = 20V, VGS = 0V, TJ = 125 C VDS = 10V, VGS = 10V 12 25 0.8 1.2 2.5 V LIMITS UNIT MIN TYP MAX
250 nA 25 250 A A
1
APR-14-2003
NIKO-SEM
N-Channel Logic Level Enhancement Mode Field Effect Transistor
VGS = 5V, ID = 12A VGS = 10V, ID = 12A VDS = 15V, ID = 12A DYNAMIC
P3057LD
TO-252 (DPAK)
Drain-Source On-State Resistance1 Forward Transconductance1
RDS(ON) gfs
70 48 16
115 85
m S
Input Capacitance Output Capacitance
www..com Reverse Transfer
Ciss Coss Crss Qg Qgs Qgd td(on) tr td(off) tf VDS = 15V, RL = 1 ID 12A, VGS = 10V, RGS = 2.5 VDS = 0.5V(BR)DSS, VGS = 10V, ID = 6A VGS = 0V, VDS = 15V, f = 1MHz
450 200 60 15 2.0 7.0 6.0 6.0 20 5.0 nS nC pF
Capacitance
2
Total Gate Charge
Gate-Source Charge2 Gate-Drain Charge
2 2
Turn-On Delay Time2 Rise Time
Turn-Off Delay Time2 Fall Time2
SOURCE-DRAIN DIODE RATINGS AND CHARACTERISTICS (TC = 25 C) Continuous Current Pulsed Current
3
IS ISM VSD trr IRM(REC) Qrr IF = IS, dlF/dt = 100A / S IF = IS, VGS = 0V 30 15 0.043
12 20 1.5
A V nS A C
Forward Voltage1 Reverse Recovery Time Peak Reverse Recovery Current Reverse Recovery Charge
1 2
Pulse test : Pulse Width 300 sec, Duty Cycle 2%. Independent of operating temperature. 3 Pulse width limited by maximum junction temperature. REMARK: THE PRODUCT MARKED WITH "P3057LD", DATE CODE or LOT #
2
APR-14-2003
NIKO-SEM
N-Channel Logic Level Enhancement Mode Field Effect Transistor
P3057LD
TO-252 (DPAK)
www..com
3
APR-14-2003
NIKO-SEM
N-Channel Logic Level Enhancement Mode Field Effect Transistor
P3057LD
TO-252 (DPAK)
TO-252 (DPAK) MECHANICAL DATA
mm Min. 9.35 2.20 0.48 0.89 0.45 0.03 5.20 Typ. Max. 10.10 2.40 0.85 1.50 0.60 0.23 6.20 mm Min. Typ. 0.80 6.40 5.00 0.55 0.60 4.40 6.60 5.50 1.10 1.00 4.60 Max.
Dimension A www..com B C D E F G
Dimension H I J K L M N
4
APR-14-2003


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